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Journal Article
R. J. Schneider, von Reden, K. F., Hayes, J. M., Wills, J. S. C., Kern, W. G. E., and Kim, S. W., Tests of positive ion beams from a microwave ion source for AMS, Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, vol. 172, no. 252-256, pp. 252-256, 2000.